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This paper was reprinted from the Proceedings : Fifth IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010. pp. 319-324, and may be found http://dx.doi.org/10.1109/DELTA.2010.45 access via this link is only available with a subscription. A full text version is available above.
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Proceedings : Fifth IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010, pp. 319-324