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This paper was reprinted from Proceedings of the Second IEEE International Workshop on Electronic Design, Test and Applications (DELTA’04), Perth, Australia, p. 89-94, and may be found at http://dx.doi.org/10.1109/DELTA.2004.10039
Copyright (2004) IEEE
Proceedings of the Second IEEE International Workshop on Electronic Design, Test and Applications (DELTA’04), pp. 89-94