Open Access. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of La Trobe University's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to firstname.lastname@example.org
By choosing to view this document, you agree to all provisions of the copyright laws protecting it.
This paper was reprinted from Proceedings of the Second IEEE International Workshop on Electronic Design, Test and Applications (DELTA’04), Perth Australia, p. 103-107, and may be found at http://dx.doi.org/10.1109/DELTA.2004.10025
Copyright (2004) IEEE
Proceedings of the Second IEEE International Workshop on Electronic Design, Test and Applications (DELTA’04), pp. 103-107