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This paper was reprinted from Proceedings of the Second IEEE International Workshop on Electronic Design, Test and Applications (DELTA’04), Perth Australia, p. 103-107, and may be found at http://dx.doi.org/10.1109/DELTA.2004.10025
Copyright (2004) IEEE
Proceedings of the Second IEEE International Workshop on Electronic Design, Test and Applications (DELTA’04), pp. 103-107