Open Access. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of La Trobe University's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to firstname.lastname@example.org
By choosing to view this document, you agree to all provisions of the copyright laws protecting it.
This paper was reprinted from Proceedings of the Fifth IEEE International Symposium on Electronic Design, Test & Applications (DELTA 2010) pp. 177-182, and may be found http://dx.doi.org/10.1109/DELTA.2010.49 access via this link is only available with a subscription. A full text version is available above.
Copyright (2010) IEEE
Proceedings of the Fifth IEEE International Symposium on Electronic Design, Test & Applications (DELTA 2010), pp. 177-182