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This paper was reprinted from Proceedings of the Fifth IEEE International Symposium on Electronic Design, Test & Applications (DELTA 2010) pp. 250-255, and may be found http://dx.doi.org/10.1109/DELTA.2010.48 access via this link is only available with a subscription. A full text version is available above.
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Proceedings of the Fifth IEEE International Symposium on Electronic Design, Test & Applications (DELTA 2010), pp. 250-255